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Ditemukan 1 dari pencarian Anda melalui kata kunci: author="Hofmann, Siegfried"
Auger- and X-Ray photoelectron spectroscopy in materials science …
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into pra…
- Edisi
- 1
- ISBN/ISSN
- 9783642273810
- Deskripsi Fisik
- XX, 528 Hlm.
- Judul Seri
- Springer Series in Surface Sciences
- No. Panggil
- E244
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