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Transmission electron microscopy and diffractometry of materials
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. Al…
- Edisi
- Fourth Edition
- ISBN/ISSN
- 9783642297618
- Deskripsi Fisik
- xx, 764 hlm.
- Judul Seri
- Graduate Texts in Physics
- No. Panggil
- E1691
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Kesenian, Hiburan, dan Olahraga 
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