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Electronic Resource

New approaches to image processing based failure analysis of nano-scale ULSI devices

Zalevsky, Zeev - Nama Orang; Livshits, Pavel - Nama Orang; Gur, Eran - Nama Orang;

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures.

Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise.

This book presents novel "smart" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization. It explains an approach for high-resolution imaging of advanced metallization for micro- and nanoelectronics. This approach obviates the time-consuming preparation and selection of microscope measurement and sample conditions, enabling not only better electron-microscopic resolution, but also more efficient testing and quality control. This in turn leads to productivity gains in design and development of nano-scale ULSI chips.

The authors also present several approaches for super-resolving low-resolution images to improve failure analysis of microelectronic chips.


Key Features :
* Acquaints users with new software-based approaches to enhance high-resolution microscope imaging of microchip structures
* Demonstrates how these methods lead to productivity gains in the development of ULSI chips
* Presents several techniques for the superresolution of images, enabling engineers and scientists to improve their results in failure analysis of microelectronic chips


Ketersediaan
#
Perpustakaan Pusat E1419
E1419
Tersedia
Informasi Detail
Judul Seri
-
No. Panggil
E1419
Penerbit
Oxford : William Andrew., 2014
Deskripsi Fisik
vii, 101 hlm. : il. warna
Bahasa
English
ISBN/ISSN
9780323241434
Klasifikasi
NONE
Tipe Isi
text
Tipe Media
computer
Tipe Pembawa
online resource
Edisi
-
Subjek
Gambar
MIkroelektronika
Bentuk Mikro
Info Detail Spesifik
-
Pernyataan Tanggungjawab
Zeev Zalevsky, Pavel Livshits and Eran Gur
Versi lain/terkait

Tidak tersedia versi lain

Lampiran Berkas
  • New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices
    https://doi.org/10.1016/C2013-0-06953-8
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