Scanning Probe Microscopy in Nanoscience and Nanotechnology | Perpustakaan Universitas Negeri Jakarta

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Scanning Probe Microscopy in Nanoscience and Nanotechnology

Bhushan, Bharat - Nama Orang;

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber

Ketersediaan

Perpustakaan Pusat E243

E243

Tersedia

Informasi Detail

Judul Seri: NanoScience and Technology
No. Panggil: E242
Penerbit: Berlin : Springer Berlin., 2010
Deskripsi Fisik: XXX, 956 Hlm.
Bahasa: English
ISBN/ISSN: 978-3-642-03535-7
Klasifikasi: NONE
Tipe Isi: text
Tipe Media: computer
Tipe Pembawa: online resource
Edisi: 1
Subjek: Engineering
Nanotechnology
Condensed Matter Physics
Info Detail Spesifik: -
Pernyataan Tanggungjawab: Bharat Bhushan

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Lampiran Berkas

Scanning Probe Microscopy in Nanoscience and Nanotechnology
https://doi.org/10.1007/978-3-642-03535-7

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