Electronic Resource

Reliability prediction from burn-in data fit to reliability models

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This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design.

Key Features :
* The ability to include reliability calculations and test results in their product design
* The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions
* Have accurate failure rate calculations for calculating warrantee period replacement costs

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Ketersediaan

Informasi Detail

Judul Seri

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No. Panggil

E1471

Penerbit

London : Academic Press., 2014

Deskripsi Fisik

x, 97 hlm.

Bahasa

English

ISBN/ISSN

9780128007471

Klasifikasi

NONE

Tipe Isi

text

Tipe Media

computer

Tipe Pembawa

online resource

Edisi

-

Subjek

Teknik Elektonika
Rancangan Sistem : Ilmu Komputer

Info Detail Spesifik

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Pernyataan Tanggungjawab

Joseph B. Bernstein

Versi lain/terkait

Lampiran Berkas

Komentar

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