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GaP heteroepitaxy on Si(100) : benchmarking surface signals when growing GaP on Si in CVD ambients

Epitaxial integration of III-V semiconductors on silicon substrates has been desired over decades for high application potential in microelectronics, photovoltaics, and beyond. The performance of optoelectronic devices is still severely impaired by critical defect mechanisms driven by the crucial polar-on-nonpolar heterointerface. This thesis reports almost lattice-matched growth of thin gallium phosphide films as a viable model system for III-V/Si(100) interface investigations. The impact of antiphase disorder on the heteroepitaxial growth surface provides quantitative optical in situ access to one of the most notorious defect mechanisms, even in the vapor phase ambient common for compound semiconductor technology. Precise control over the surface structure of the Si(100) substrates prior to III-V nucleation prevents the formation of antiphase domains. The hydrogen-based process ambient enables the preparation of anomalous double-layer step structures on Si(100), highly beneficial for subsequent III-V integration.

Ketersediaan
#
Perpustakaan Pusat E1670
E1670
Tersedia
Informasi Detail
Judul Seri
Springer Theses
No. Panggil
E1670
Penerbit
Switzerland : Springer Cham.,
Deskripsi Fisik
xiv, 143 hlm. : il. warna.
Bahasa
English
ISBN/ISSN
9783319028804
Klasifikasi
NONE
Tipe Isi
text
Tipe Media
computer
Tipe Pembawa
online resource
Edisi
-
Subjek
Semikonduktor : Perangkat Elektronik
Gallium Phosphide (GaP)
Bahan Elektronik dan Optik
Info Detail Spesifik
-
Pernyataan Tanggungjawab
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Tidak tersedia versi lain

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