No Inv.: 1840-1841/BD/Perp/87/2c
No Inv.: 449-450/BD/Perp/86/2c
No Inv.: 1780-1781/BD/Perp/87/2c~11243/P/Perp/98/1c
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due…
No Inv.: 649-650/P/Perp/97/2c
This volume will define the direction of eddy-current technology in nondestructive evaluation (NDE) in the twenty-first century. It describes the natural marriage of the computer to eddy-current NDE, and its publication was encouraged by favorable responses from workers in the nuclear-power and aerospace industries. It will be used by advanced students and practitioners in the fields of computa…
No Inv.: 11603/P/Perp/98/1c
No Inv.: 637-639/P/Perp/98/3c
No Inv.: 2267-2276/P/Perp/98/10c
Bibliografi di tiap babNo Inv.: 12145/P/Perp/98/1c~3618/P/Perp/99/1c