Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains…
No Inv.: 11236/P/Perp/98/1c
No Inv.: 146625/P/Perp/14/1c
No Inv.: 10601-10605/P/Perp/92/5c
No Inv.: 101622/P/Perp/05/1c
No Inv.: 102229/PSM/Perp/05/1c~109562/S/Perp/07/1c~109598/S/Perp/07/1c~112014-112018/P/perp/08/5c~118064-118066/P/Perp/09/3c~143402-143406/P/Perp/14/5c
No Inv.: 72611/P/00/1c
No Inv.: 83791/P/Perp/FT/02/1c
Bibliografi : hlm. 395-396 No Inv.: 135269 /SM/Perp/13/1c
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing a…