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Ditemukan 1 dari pencarian Anda melalui kata kunci: author=Bernstein, Joseph B.
Reliability prediction from burn-in data fit to reliability models
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing c…
- Edisi
- -
- ISBN/ISSN
- 9780128007471
- Deskripsi Fisik
- x, 97 hlm.
- Judul Seri
- -
- No. Panggil
- E1471
Karya Umum 
Filsafat 
Agama 
Ilmu-ilmu Sosial 
Bahasa 
Ilmu-ilmu Murni 
Ilmu-ilmu Terapan 
Kesenian, Hiburan, dan Olahraga 
Kesusastraan 
Geografi dan Sejarah