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Scanning Probe Microscopy in Nanoscience and Nanotechnology
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical sur…
- Edisi
- 1
- ISBN/ISSN
- 978-3-642-03535-7
- Deskripsi Fisik
- XXX, 956 Hlm.
- Judul Seri
- NanoScience and Technology
- No. Panggil
- E242
Karya Umum 
Filsafat 
Agama 
Ilmu-ilmu Sosial 
Bahasa 
Ilmu-ilmu Murni 
Ilmu-ilmu Terapan 
Kesenian, Hiburan, dan Olahraga 
Kesusastraan 
Geografi dan Sejarah