# /var/www/html/web-perpus/public/slims2/lib/SearchEngine/DefaultEngine.php:608
^ "Engine ⚙️ : SLiMS\SearchEngine\DefaultEngine"

^ "SQL ⚒️"

^ array:2 [
  "count" => "select count(distinct b.biblio_id) from biblio as b left join mst_publisher as mp on b.publisher_id=mp.publisher_id left join mst_place as mpl on b.publish_place_id=mpl.place_id where b.opac_hide=0 and (b.biblio_id in(select ba.biblio_id from biblio_author as ba left join mst_author as ma on ba.author_id=ma.author_id where ma.author_name like ?))"
  "query" => "select b.biblio_id, b.title, b.image, b.isbn_issn, b.publish_year, mp.publisher_name as `publisher`, mpl.place_name as `publish_place`, b.labels, b.input_date, b.edition, b.collation, b.series_title, b.call_number from biblio as b left join mst_publisher as mp on b.publisher_id=mp.publisher_id left join mst_place as mpl on b.publish_place_id=mpl.place_id where b.opac_hide=0 and (b.biblio_id in(select ba.biblio_id from biblio_author as ba left join mst_author as ma on ba.author_id=ma.author_id where ma.author_name like ?)) order by b.last_update desc limit 10 offset 0"
]

^ "Bind Value ⚒️"

^ array:1 [
  0 => "%Crandall, Erika R.%"
]

Factors governing tin whisker growth

Komentar Penanda Bagikan

Crandall, Erika R.

Tin (Sn) whiskers are electrically conductive, single crystal eruptions that grow from Sn film surfaces. Their high aspect ratio presents reliability problems for the electronics industry due to bridging and metal arcing, leading to malfunctions and catastrophic failures in many electronic systems (including satellite and defense sectors). Due to legislation in the EU, Japan, and the U.S., mand…

Edisi

-

ISBN/ISSN

9783319004709

Deskripsi Fisik

xii, 136 hlm. : il. warna.

Judul Seri

Springer Theses

No. Panggil

E1651

Ketersediaan1

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