Tin (Sn) whiskers are electrically conductive, single crystal eruptions that grow from Sn film surfaces. Their high aspect ratio presents reliability problems for the electronics industry due to bridging and metal arcing, leading to malfunctions and catastrophic failures in many electronic systems (including satellite and defense sectors). Due to legislation in the EU, Japan, and the U.S., mand…
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Bibliografi : hlm. 349-352
Termasuk bibliografi
Bibliografi : hlm. 317-322
Judul asli : "Effective Supervision in a Factory"
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