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New approaches to image processing based failure analysis of nano-scale ULSI …
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking of feature size in microe…
- Edisi
- -
- ISBN/ISSN
- 9780323241434
- Deskripsi Fisik
- vii, 101 hlm. : il. warna
- Judul Seri
- -
- No. Panggil
- E1419
Karya Umum 
Filsafat 
Agama 
Ilmu-ilmu Sosial 
Bahasa 
Ilmu-ilmu Murni 
Ilmu-ilmu Terapan 
Kesenian, Hiburan, dan Olahraga 
Kesusastraan 
Geografi dan Sejarah