Electronic Resource

Transmission electron microscopy and diffractometry of materials

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

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Ketersediaan

Informasi Detail

Judul Seri

Graduate Texts in Physics

No. Panggil

E1691

Penerbit

Heidelberg : Springer Berlin., 2013

Deskripsi Fisik

xx, 764 hlm.

Bahasa

English

ISBN/ISSN

9783642297618

Klasifikasi

NONE

Tipe Isi

text

Tipe Media

computer

Tipe Pembawa

online resource

Edisi

Fourth Edition

Subjek

Mikroskop Transmisi Elektron
Difraksi Sinar-X

Info Detail Spesifik

-

Pernyataan Tanggungjawab

Brent Fultz, James Howe

Versi lain/terkait

Lampiran Berkas

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