Bibliografi : hlm. 561-590
Bibliografi : hlm. 163-164
Bibliografi : hlm. 231
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking of feature size in microe…
No Inv.: 836-845/Perp/89/10c
No Inv.: 11759/P/Perp/98/1c